 1817 - 1890 (73 years)
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| Name |
Simon House [1] |
| Birth |
1817 |
New York  [2] |
| Gender |
Male |
| Death |
1890 [1] |
| Burial |
Bidwell Cemetery, Parish, Oswego County, New York [1] |
| Notes |
- From the Maybee Society files. Not all data is verified. Say dates are estimates and are probably within 20 years. The Maybee Society keeps its data on The Master Genealogist�, and has been modified by Gary Hester?s WIT2NOTE� to form the GedCom file. This information is also available in a TMG file.
|
| Person ID |
I33339 |
Glenn Cook Family |
| Last Modified |
30 Nov 2006 |
| Father |
Abraham House, b. 26 Apr 1786 d. 20 May 1865 (Age 79 years) |
| Mother |
Nancy Hannah Maybee, b. 26 Sep 1790, Canajoharie Castle, Montgomery County, New York d. 4 Oct 1856, Parish, Oswego County, New York (Age 66 years) |
| Marriage |
22 Feb 1809 [3] |
| Census |
25 Jul 1850 |
Parish, Oswego County, New York [4] |
- Abraham House, 64, M, Farmer, $3000New York
Nancy House, 60, F, New York
Hannah House, 36, F, New York
Leonard House, 23, M, New York
Coonrod House, 18, M, New York
Edward House, 8, M, New York
Emily , 15, F, New York
|
| Anecdote |
- Nancy Hannah Maybie daughter of David Maybie and Nancy
Freymeyer who is said to have lived near Stone Arabia,married
Abraham House Their children are Andrew, Philena, Simon,
Caroline, Abraham, Alonzo, Leonard, Norman (who went to Chile
South America and died there), Conrad and Emily. All except
Norman lived in Oswego County.
|
| Family ID |
F551605299 |
Group Sheet | Family Chart |
-
| Sources |
- [S1240] Steve Mabie, MS 257 - Steve Mabie, FROM TOWN HISTORIAN, PARISH NY, FROM THIER TOMBSTONES (Reliability: 3).
- [S1275] Steve Mabie, Steve Mabie, A Chronology of Mabie Records. Albany, Schenectady, Montgomery and Herkimer Counties, FROM THE RECORDS OF THE REV. DANIEL NASH IN CENTRAL NEW YORK STATE (Reliability: 3).
- [S1240] Steve Mabie, MS 257 - Steve Mabie, FROM TOWN HISTORIAN, PARISH NY (Reliability: 3).
- [S1247] Ancestry.com, 1850 CENSUS, PARISH, OSWEGO, NEW YORK, PAGE 11, ROLL M432_577 (Reliability: 3).
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